DRA725: 反复上下电测试造成寄存器值改变
Part Number:DRA725 TI chip:dra725 TI sdk version:tisdk-rootfs-image-dra7xx-evm_vsdk_3_5 1、Switch machine test repe...
Part Number:DRA725 TI chip:dra725 TI sdk version:tisdk-rootfs-image-dra7xx-evm_vsdk_3_5 1、Switch machine test repe...
Part Number:DRA725 Under the car on the electrical test cause register values change.docx Cherry Zhou: 您好我们已收到您的问题并升级到英文...