TI中文支持网我是TMDSEVM6678L的板子，使用了XDS200U型的仿真器，CCS是6.0.1版本，机器Win10
但连接不上，下面是Test Connection的结果：请问都可能是什么问题啊，谢谢！
[Start: Texas Instruments XDS2xx USB Emulator_0]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity
[Result]
—–[Print the board config pathname(s)]————————————
C:\Users\Wenbin\AppData\Local\TEXASI~1\CCS\
ti\0\0\BrdDat\testBoard.dat
—–[Print the reset-command software log-file]—————————–
This utility has selected a 560/2xx-class product.
This utility will load the program 'xds2xxu.out'.
The library build date was 'May 21 2014'.
The library build time was '18:02:25'.
The library package version is '5.1.507.0'.
The library component version is '35.34.40.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '13' (0x0000000d).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
—–[Print the reset-command hardware log-file]—————————–
This emulator does not create a reset log-file.
—–[An error has occurred and this utility has aborted]——————–
This error is generated by TI's USCIF driver or utilities.
The value is '-233' (0xffffff17).
The title is 'SC_ERR_PATH_BROKEN'.
The explanation is:
The JTAG IR and DR scan-paths cannot circulate bits, they may be broken.
An attempt to scan the JTAG scan-path has failed.
The target's JTAG scan-path appears to be broken
with a stuck-at-ones or stuck-at-zero fault.
[End: Texas Instruments XDS2xx USB Emulator_0]
Shine：
请问有没有把boot mode设成no boot模式？
processors.wiki.ti.com/…/TMDXEVM6678L_EVM_Hardware_Setup
user5230664：
回复 Shine:
您好，我之前没有设置no boot，但我设置好之后full reset了之后还是同样的输出
user5230664：
回复 Shine:
我是新手刚接触这个东西，请问有没有好的入门教程和示例程序可以参考啊，谢谢！
Shine：
回复 user5230664:
那板子上自带的xds100仿真功能能连接吗？
user5230664：
回复 Shine:
可以的，我试过那个自带的串口通信程序
Shine：
回复 user5230664:
板子上自带的xds100仿真功能的用法如下。
processors.wiki.ti.com/…/BIOS_MCSDK_2.0_Getting_Started_Guide
user5230664：
回复 Shine:
您好，板子上自带的仿真器好像也有问题，这是测试结果：
[Start: Texas Instruments XDS100v1 USB Emulator_0]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
[Result]
—–[Print the board config pathname(s)]————————————
C:\Users\Wenbin\AppData\Local\TEXASI~1\CCS\ ti\0\0\BrdDat\testBoard.dat
—–[Print the reset-command software log-file]—————————–
This utility has selected a 100- or 510-class product.This utility will load the adapter 'jioserdesusb.dll'.The library build date was 'May 21 2014'.The library build time was '17:19:59'.The library package version is '5.1.507.0'.The library component version is '35.34.40.0'.The controller does not use a programmable FPGA.The controller has a version number of '4' (0x00000004).The controller has an insertion length of '0' (0x00000000).This utility will attempt to reset the controller.This utility has successfully reset the controller.
—–[Print the reset-command hardware log-file]—————————–
The scan-path will be reset by toggling the JTAG TRST signal.The controller is the FTDI FT2232 with USB interface.The link from controller to target is direct (without cable).The software is configured for FTDI FT2232 features.The controller cannot monitor the value on the EMU[0] pin.The controller cannot monitor the value on the EMU[1] pin.The controller cannot control the timing on output pins.The controller cannot control the timing on input pins.The scan-path link-delay has been set to exactly '0' (0x0000).
—–[The log-file for the JTAG TCLK output generated from the PLL]———-
There is no hardware for programming the JTAG TCLK frequency.
—–[Measure the source and frequency of the final JTAG TCLKR input]——–
There is no hardware for measuring the JTAG TCLK frequency.
—–[Perform the standard path-length test on the JTAG IR and DR]———–
This path-length test uses blocks of 512 32-bit words.
The test for the JTAG IR instruction path-length failed.The JTAG IR instruction scan-path is stuck-at-ones.
The test for the JTAG DR bypass path-length failed.The JTAG DR bypass scan-path is stuck-at-ones.
—–[Perform the Integrity scan-test on the JTAG IR]————————
This test will use blocks of 512 32-bit words.This test will be applied just once.
Do a test using 0xFFFFFFFF.Scan tests: 1, skipped: 0, failed: 0Do a test using 0x00000000.Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.The details of the first 8 errors have been provided.The utility will now report only the count of failed tests.Scan tests: 2, skipped: 0, failed: 1Do a test using 0xFE03E0E2.Scan tests: 3, skipped: 0, failed: 2Do a test using 0x01FC1F1D.Scan tests: 4, skipped: 0, failed: 3Do a test using 0x5533CCAA.Scan tests: 5, skipped: 0, failed: 4Do a test using 0xAACC3355.Scan tests: 6, skipped: 0, failed: 5Some of the values were corrupted – 83.3 percent.
The JTAG IR Integrity scan-test has failed.
—–[Perform the Integrity scan-test on the JTAG DR]————————
This test will use blocks of 512 32-bit words.This test will be applied just once.
Do a test using 0xFFFFFFFF.Scan tests: 1, skipped: 0, failed: 0Do a test using 0x00000000.Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.The details of the first 8 errors have been provided.The utility will now report only the count of failed tests.Scan tests: 2, skipped: 0, failed: 1Do a test using 0xFE03E0E2.Scan tests: 3, skipped: 0, failed: 2Do a test using 0x01FC1F1D.Scan tests: 4, skipped: 0, failed: 3Do a test using 0x5533CCAA.Scan tests: 5, skipped: 0, failed: 4Do a test using 0xAACC3355.Scan tests: 6, skipped: 0, failed: 5Some of the values were corrupted – 83.3 percent.
The JTAG DR Integrity scan-test has failed.
[End: Texas Instruments XDS100v1 USB Emulator_0]
user5230664：
回复 Shine:
您好，请问能否再帮我跟进一下？上个帖子回复了自带xds100仿真器的测试情况，谢谢！
Shine：
回复 user5230664:
请问是完全按照上面getting started guide里的步骤做的吗？方便的话，把target configuration file的配置和boot管脚的配置发个截图看看。
