TI中文支持网参照DEC28335作的，第一次可以连接，烧写不成功，再连接不上，问题如下
Error connecting to the target: (Error -233 @ 0x0) The JTAG IR and DR scan-paths cannot circulate bits, they may be broken. An attempt to scan the JTAG scan-path has failed. The target's JTAG scan-path appears to be broken with a stuck-at-ones or stuck-at-zero fault. (Emulation package 5.1.232.0)
mangui zhang：
如果购买的第三方的开发套件 请参考相关文件进行配置
一般来说 仿真器驱动需要安装到CCS同一目录下
然后在CCS Setup设置好 连接好JTAG接线 目标板上电 连接测试
第一次使用会遇到一些问题
参照DEC28335作的，第一次可以连接，烧写不成功，再连接不上，问题如下
Error connecting to the target: (Error -233 @ 0x0) The JTAG IR and DR scan-paths cannot circulate bits, they may be broken. An attempt to scan the JTAG scan-path has failed. The target's JTAG scan-path appears to be broken with a stuck-at-ones or stuck-at-zero fault. (Emulation package 5.1.232.0)
Joey Mao：
你可以看下这个帖子：
http://www.deyisupport.com/question_answer/microcontrollers/c2000/f/56/t/7152.aspx
参照DEC28335作的，第一次可以连接，烧写不成功，再连接不上，问题如下
Error connecting to the target: (Error -233 @ 0x0) The JTAG IR and DR scan-paths cannot circulate bits, they may be broken. An attempt to scan the JTAG scan-path has failed. The target's JTAG scan-path appears to be broken with a stuck-at-ones or stuck-at-zero fault. (Emulation package 5.1.232.0)
laiwei ding：
您好，我现在遇到了跟您一样的问题，我是一块28335的板子，第一次往里烧程序的时候是正确的，后来往里烧写的时候不知道是操作的问题还是其他原因，现在已经无法连接上了，不知道您那解决没有。The JTAG IR and DR scan-paths cannot circulate bits, they may be broken. An attempt to scan the JTAG scan-path has failed. The target's JTAG scan-path appears to be broken with a stuck-at-ones or stuck-at-zero fault.求解答。谢谢！
参照DEC28335作的，第一次可以连接，烧写不成功，再连接不上，问题如下
Error connecting to the target: (Error -233 @ 0x0) The JTAG IR and DR scan-paths cannot circulate bits, they may be broken. An attempt to scan the JTAG scan-path has failed. The target's JTAG scan-path appears to be broken with a stuck-at-ones or stuck-at-zero fault. (Emulation package 5.1.232.0)
Eric Ma：
回复 laiwei ding:
你有没有用别的仿真器测试一下，看是哪个硬件的问题？
还有有没有加密？
ERIC
参照DEC28335作的，第一次可以连接，烧写不成功，再连接不上，问题如下
Error connecting to the target: (Error -233 @ 0x0) The JTAG IR and DR scan-paths cannot circulate bits, they may be broken. An attempt to scan the JTAG scan-path has failed. The target's JTAG scan-path appears to be broken with a stuck-at-ones or stuck-at-zero fault. (Emulation package 5.1.232.0)
YONG WANG13：
回复 laiwei ding:
你好，请问你解决问题没有啊，我和你一样的问题，我买的开发板没有问题，但买的官方电机伺服套件就有问题。
参照DEC28335作的，第一次可以连接，烧写不成功，再连接不上，问题如下
Error connecting to the target: (Error -233 @ 0x0) The JTAG IR and DR scan-paths cannot circulate bits, they may be broken. An attempt to scan the JTAG scan-path has failed. The target's JTAG scan-path appears to be broken with a stuck-at-ones or stuck-at-zero fault. (Emulation package 5.1.232.0)
laiwei ding：
回复 YONG WANG13:
我的问题是烧程序的时候，没有把复位键关掉，导致在程序的过程中，一直在复位，导致28335里面出现问题，后来换了一块28335就好了
参照DEC28335作的，第一次可以连接，烧写不成功，再连接不上，问题如下
Error connecting to the target: (Error -233 @ 0x0) The JTAG IR and DR scan-paths cannot circulate bits, they may be broken. An attempt to scan the JTAG scan-path has failed. The target's JTAG scan-path appears to be broken with a stuck-at-ones or stuck-at-zero fault. (Emulation package 5.1.232.0)
Eric Ma：
回复 laiwei ding:
如果在烧写程序过程，受到干扰，轻者烧写程序内容异常，重则芯片锁死。
ERIC
参照DEC28335作的，第一次可以连接，烧写不成功，再连接不上，问题如下
Error connecting to the target: (Error -233 @ 0x0) The JTAG IR and DR scan-paths cannot circulate bits, they may be broken. An attempt to scan the JTAG scan-path has failed. The target's JTAG scan-path appears to be broken with a stuck-at-ones or stuck-at-zero fault. (Emulation package 5.1.232.0)
chenshanshan chen：
回复 laiwei ding:
您好 请问您后来是怎么解决的 谢谢
参照DEC28335作的，第一次可以连接，烧写不成功，再连接不上，问题如下
Error connecting to the target: (Error -233 @ 0x0) The JTAG IR and DR scan-paths cannot circulate bits, they may be broken. An attempt to scan the JTAG scan-path has failed. The target's JTAG scan-path appears to be broken with a stuck-at-ones or stuck-at-zero fault. (Emulation package 5.1.232.0)
Junying Li：
你好我也出现了这个问题，您解决了吗
