XDS100V2与TMS570LS3137通讯异常

• 自己参考mcbtms570评估板（主芯片为TMS570LS20216）做的板子（主芯片为TMS570LS3137）。

• 当前状态：

• 1. 所有供电和时钟都正常；

• 2. XDS100V2的固件正常，使用xds100serial工具检测仿真器正常；

• 3.TMS, TDI, TDO,TCK, RTCK, XDS_JTAG_RESET, XDS_JTAG_TRST与评估板设计一致；

• 4. TMS570的NERROR信号为高。

• 遇到的问题：

• 使用CCS6.2建立工程，进行仿真器连接测试时，TMS, TDI, TCK, RTCK, XDS_JTAG_RESET, XDS_JTAG_TRST的信号与评估板一致，但与TMS570连接的TDO一直为低电平。

• 而使用评估板连接正常。

• ccs6.2仿真器连接测试结果如下：

• [Start]

  Execute the command:

  %ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

  [Result]

  —–[Print the board config pathname(s)]————————————

  /root/.TI/1524211065/0/0/BrdDat/testBoard.dat

  —–[Print the reset-command software log-file]—————————–

  This utility has selected a 100- or 510-class product.
  This utility will load the adapter 'libjioserdesusb.so'.
  The library build date was 'DEC 6 2017'.
  The library build time was '00:19:23'.
  The library package version is '5.1.232.0'.
  The library component version is '35.34.40.0'.
  The controller does not use a programmable FPGA.
  The controller has a version number of '4' (0x00000004).
  The controller has an insertion length of '0' (0x00000000).
  This utility will attempt to reset the controller.
  This utility has successfully reset the controller.

  —–[Print the reset-command hardware log-file]—————————–

  The scan-path will be reset by toggling the JTAG TRST signal.
  The controller is the FTDI FT2232 with USB interface.
  The link from controller to target is direct (without cable).
  The software is configured for FTDI FT2232 features.
  The controller cannot monitor the value on the EMU[0] pin.
  The controller cannot monitor the value on the EMU[1] pin.
  The controller cannot control the timing on output pins.
  The controller cannot control the timing on input pins.
  The scan-path link-delay has been set to exactly '0' (0x0000).

  —–[The log-file for the JTAG TCLK output generated from the PLL]———-

  There is no hardware for programming the JTAG TCLK frequency.

  —–[Measure the source and frequency of the final JTAG TCLKR input]——–

  There is no hardware for measuring the JTAG TCLK frequency.

  —–[Perform the standard path-length test on the JTAG IR and DR]———–

  This path-length test uses blocks of 64 32-bit words.

  The test for the JTAG IR instruction path-length failed.
  The JTAG IR instruction scan-path is stuck-at-zero.

  The test for the JTAG DR bypass path-length failed.
  The JTAG DR bypass scan-path is stuck-at-zero.

  —–[Perform the Integrity scan-test on the JTAG IR]————————

  This test will use blocks of 64 32-bit words.
  This test will be applied just once.

  Do a test using 0xFFFFFFFF.
  Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x00000000.
  Test 1 Word 1: scanned out 0xFFFFFFFF and scanned in 0x00000000.
  Test 1 Word 2: scanned out 0xFFFFFFFF and scanned in 0x00000000.
  Test 1 Word 3: scanned out 0xFFFFFFFF and scanned in 0x00000000.
  Test 1 Word 4: scanned out 0xFFFFFFFF and scanned in 0x00000000.
  Test 1 Word 5: scanned out 0xFFFFFFFF and scanned in 0x00000000.
  Test 1 Word 6: scanned out 0xFFFFFFFF and scanned in 0x00000000.
  Test 1 Word 7: scanned out 0xFFFFFFFF and scanned in 0x00000000.
  The details of the first 8 errors have been provided.
  The utility will now report only the count of failed tests.
  Scan tests: 1, skipped: 0, failed: 1
  Do a test using 0x00000000.
  Scan tests: 2, skipped: 0, failed: 1
  Do a test using 0xFE03E0E2.
  Scan tests: 3, skipped: 0, failed: 2
  Do a test using 0x01FC1F1D.
  Scan tests: 4, skipped: 0, failed: 3
  Do a test using 0x5533CCAA.
  Scan tests: 5, skipped: 0, failed: 4
  Do a test using 0xAACC3355.
  Scan tests: 6, skipped: 0, failed: 5
  Some of the values were corrupted – 83.3 percent.

  The JTAG IR Integrity scan-test has failed.

  —–[Perform the Integrity scan-test on the JTAG DR]————————

  This test will use blocks of 64 32-bit words.
  This test will be applied just once.

  Do a test using 0xFFFFFFFF.
  Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x00000000.
  Test 1 Word 1: scanned out 0xFFFFFFFF and scanned in 0x00000000.
  Test 1 Word 2: scanned out 0xFFFFFFFF and scanned in 0x00000000.
  Test 1 Word 3: scanned out 0xFFFFFFFF and scanned in 0x00000000.
  Test 1 Word 4: scanned out 0xFFFFFFFF and scanned in 0x00000000.
  Test 1 Word 5: scanned out 0xFFFFFFFF and scanned in 0x00000000.
  Test 1 Word 6: scanned out 0xFFFFFFFF and scanned in 0x00000000.
  Test 1 Word 7: scanned out 0xFFFFFFFF and scanned in 0x00000000.
  The details of the first 8 errors have been provided.
  The utility will now report only the count of failed tests.
  Scan tests: 1, skipped: 0, failed: 1
  Do a test using 0x00000000.
  Scan tests: 2, skipped: 0, failed: 1
  Do a test using 0xFE03E0E2.
  Scan tests: 3, skipped: 0, failed: 2
  Do a test using 0x01FC1F1D.
  Scan tests: 4, skipped: 0, failed: 3
  Do a test using 0x5533CCAA.
  Scan tests: 5, skipped: 0, failed: 4
  Do a test using 0xAACC3355.
  Scan tests: 6, skipped: 0, failed: 5
  Some of the values were corrupted – 83.3 percent.

  The JTAG DR Integrity scan-test has failed.

  [End]

• 想要得到的帮助：

• 1. 请问此错误可能的原因是什么？（因为在同一软件环境，评估板正常，但自己的板子报错，所以推测是硬件问题，但是JTAG处的电路设计与评估板完全一致，除TDO管脚外，其他JTAG信号用示波器测试都正常）

• 2. 如何隔离问题，究竟是仿真器端的问题，还是TMS570没有正常工作？

• 3.如何验证TMS570是否已经正常工作？在无法烧入程序的前提下，如何判断TMS570的工作状态？

• 请论坛的各位大神指点指点。

gaoyang9992006：

最小系统也要按照官方的做，应该是没问题的，检查一下看看是不是什么复位电路没有按照官方的原理图设计。

da zhang：

回复 gaoyang9992006:

谢谢，请问有什么方法可以在未烧写程序的时候验证MCU是否工作正常，比如通过哪些引脚可以确定MCU已开始工作？

HG：

回复 da zhang:

没烧写程序不好看啊，只能在外围转转，量量一些典型引脚的电平，晶振是不是对。