TI中文支持网Part Number:TMS320C6678
你好，我在使用TMDSEVM6678L开发板上面的XDS100调试器与CCS软件调试时无法连接到设备，做test connection的时候显示发下信息：
[Start: Texas Instruments XDS100v1 USB Debug Probe_0]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
[Result]
—–[Print the board config pathname(s)]————————————
C:\Users\yuxia\AppData\Local\TEXASI~1\CCS\
ti\0\0\BrdDat\testBoard.dat
—–[Print the reset-command software log-file]—————————–
This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'Dec 9 2016'.
The library build time was '13:48:53'.
The library package version is '6.0.504.1'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
—–[Print the reset-command hardware log-file]—————————–
The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).
—–[The log-file for the JTAG TCLK output generated from the PLL]———-
There is no hardware for programming the JTAG TCLK frequency.
—–[Measure the source and frequency of the final JTAG TCLKR input]——–
There is no hardware for measuring the JTAG TCLK frequency.
—–[Perform the standard path-length test on the JTAG IR and DR]———–
This path-length test uses blocks of 64 32-bit words.
The JTAG IR instruction path-length was not recorded.
—–[Perform the Integrity scan-test on the JTAG IR]————————
This test will use blocks of 64 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
—–[An error has occurred and this utility has aborted]——————–
This error is generated by TI's USCIF driver or utilities.
The value is '-154' (0xffffff66).
The title is 'SC_ERR_FTDI_WRITE'.
The explanation is:
One of the FTDI driver functions used to
write data returned bad status or an error.
[End: Texas Instruments XDS100v1 USB Debug Probe_0]
请问这种问题要怎么解决？谢谢。
Shine：
请看一下是否按照附件文档里的步骤操作的？
3187.Connecting To An LCEVM with CCS.zip
,
xiao yu：
好的，谢谢。
,
Shine：
不客气~
如果后续有问题可以再回复这个帖子。
