TMDSCNCD280039C: TMDSCNCD280039C XDS110 DEBUG PROBE

Hi 

import project C:\TI\c2000\C2000Ware_4_01_00_00\driverlib\f28003x\examples\sdspi\

sd_fat32_exfat.c or sd_fat32.c

進入debug mode, 怎麼出現這樣的畫面(只有新導入的這兩個project),  回到前一個專案又運行, 要如何解這個問題?

謝謝!

Louis

Green Deng：

你好，是只有在debug这个例程的时候才会出现这个报错吗？

仿真器连接测试能否通过？

TI官方资料描述这个报错一般是硬件问题引起的，你可以看一下这个页面中的“Device register”部分：software-dl.ti.com/…/ccsv7_debugging_jtag_connectivity_issues.html

,

Louis Huang：

Hi Green,

今天在別的專案(目標硬件是一樣的)用了一天並沒有甚麼異狀, 我看了一下test connection 結果與專案sd_fat32.c 不能進入XDS110 debug probe 的test connection的結果是一致我分享給你看一下, 所以其它專案都能進入debug, 唯獨要測試c2000ware 4.1.0.0新增的sd spi應用庫, 發現了這個問題, 所以求助! 

另外, 今日將多個 c2000ware 4.0.0.0的升級到4.1.0.0也都可以進入XDS110 debug probe (TMDSEMU110-U)

我是為了這個sd_fat32於前日才升級這個c2000ware 4.1.0.0, 若有需要其他測試或需要說明哪些情況可以跟我說!

Thanks

Louis

[Start: Texas Instruments XDS110 USB Debug Probe_0]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity

[Result]

—–[Print the board config pathname(s)]————————————

C:\Users\LOUIS_~1\AppData\Local\TEXASI~1\ CCS\ccs1100\0\0\BrdDat\testBoard.dat

—–[Print the reset-command software log-file]—————————–

This utility has selected a 100- or 510-class product.This utility will load the adapter 'jioxds110.dll'.The library build date was 'Dec 8 2021'.The library build time was '11:16:32'.The library package version is '9.6.0.00172'.The library component version is '35.35.0.0'.The controller does not use a programmable FPGA.The controller has a version number of '5' (0x00000005).The controller has an insertion length of '0' (0x00000000).This utility will attempt to reset the controller.This utility has successfully reset the controller.

—–[Print the reset-command hardware log-file]—————————–

The scan-path will be reset by toggling the JTAG TRST signal.The controller is the XDS110 with USB interface.The link from controller to target is direct (without cable).The software is configured for XDS110 features.The controller cannot monitor the value on the EMU[0] pin.The controller cannot monitor the value on the EMU[1] pin.The controller cannot control the timing on output pins.The controller cannot control the timing on input pins.The scan-path link-delay has been set to exactly '0' (0x0000).

—–[Perform the Integrity scan-test on the JTAG IR]————————

This test will use blocks of 64 32-bit words.This test will be applied just once.

Do a test using 0xFFFFFFFF.Scan tests: 1, skipped: 0, failed: 0Do a test using 0x00000000.Scan tests: 2, skipped: 0, failed: 0Do a test using 0xFE03E0E2.Scan tests: 3, skipped: 0, failed: 0Do a test using 0x01FC1F1D.Scan tests: 4, skipped: 0, failed: 0Do a test using 0x5533CCAA.Scan tests: 5, skipped: 0, failed: 0Do a test using 0xAACC3355.Scan tests: 6, skipped: 0, failed: 0All of the values were scanned correctly.

The JTAG IR Integrity scan-test has succeeded.

—–[Perform the Integrity scan-test on the JTAG DR]————————

This test will use blocks of 64 32-bit words.This test will be applied just once.

Do a test using 0xFFFFFFFF.Scan tests: 1, skipped: 0, failed: 0Do a test using 0x00000000.Scan tests: 2, skipped: 0, failed: 0Do a test using 0xFE03E0E2.Scan tests: 3, skipped: 0, failed: 0Do a test using 0x01FC1F1D.Scan tests: 4, skipped: 0, failed: 0Do a test using 0x5533CCAA.Scan tests: 5, skipped: 0, failed: 0Do a test using 0xAACC3355.Scan tests: 6, skipped: 0, failed: 0All of the values were scanned correctly.

The JTAG DR Integrity scan-test has succeeded.

[End: Texas Instruments XDS110 USB Debug Probe_0]

,

Green Deng：

很抱歉，因为手头还没有这款开发板以及这款芯片的其他开发板，所以无法测试例程的问题。我在英文E2E发布了一下这个问题，你可以跟进一下帖子回复：

e2e.ti.com/…/tmdscncd280039c-question-about-sd_fat32-c

,

Louis Huang：

Hi Green,

問題解開了!

TKS

Louis

,

Green Deng：

感谢反馈，方便的话可以分享一下解决方案。

,

Louis Huang：

Dear Green,

非常樂意!

按著你前一封郵件的連接, 即可解決這個問題.  我一直都沒有注意到project->targetConfigs->TMS320F280039C.ccxml 必須是"[Active]"狀態才能進入probe debug.

設定如圖:

TKS

Louis

,

Green Deng：

非常感谢反馈！