TI中文支持网在使用xds100v2烧写28335的板子是，test connection 结果如下
[Start: Texas Instruments XDS100v2 USB Emulator_0]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
[Result]
—–[Print the board config pathname(s)]————————————
C:\Users\wuyichao\AppData\Local\TEXASI~1\
CCS\ccs6\0\0\BrdDat\testBoard.dat
—–[Print the reset-command software log-file]—————————–
This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'Mar 9 2014'.
The library build time was '22:27:48'.
The library package version is '5.1.450.0'.
The library component version is '35.34.40.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
—–[Print the reset-command hardware log-file]—————————–
The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).
—–[The log-file for the JTAG TCLK output generated from the PLL]———-
There is no hardware for programming the JTAG TCLK frequency.
—–[Measure the source and frequency of the final JTAG TCLKR input]——–
There is no hardware for measuring the JTAG TCLK frequency.
—–[Perform the standard path-length test on the JTAG IR and DR]———–
This path-length test uses blocks of 512 32-bit words.
The test for the JTAG IR instruction path-length failed.
The JTAG IR instruction scan-path is stuck-at-ones.
The test for the JTAG DR bypass path-length failed.
The JTAG DR bypass scan-path is stuck-at-ones.
—–[Perform the Integrity scan-test on the JTAG IR]————————
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted – 83.3 percent.
The JTAG IR Integrity scan-test has failed.
—–[Perform the Integrity scan-test on the JTAG DR]————————
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Test 1 Word 370: scanned out 0xFFFFFFFF and scanned in 0xFFFFFDFF.
Test 1 Word 371: scanned out 0xFFFFFFFF and scanned in 0xFEFFFFFF.
Test 1 Word 372: scanned out 0xFFFFFFFF and scanned in 0xFFCEFF7F.
Test 1 Word 373: scanned out 0xFFFFFFFF and scanned in 0xEFFEFAAF.
Test 1 Word 374: scanned out 0xFFFFFFFF and scanned in 0x76482B79.
Test 1 Word 375: scanned out 0xFFFFFFFF and scanned in 0xE918F739.
Test 1 Word 376: scanned out 0xFFFFFFFF and scanned in 0x917771C4.
Test 1 Word 377: scanned out 0xFFFFFFFF and scanned in 0x074CFA7B.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 2
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 3
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 4
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 5
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 6
Some of the values were corrupted – 80.1 percent.
The JTAG DR Integrity scan-test has failed.
[End: Texas Instruments XDS100v2 USB Emulator_0]
在使用另外一块同样设计的板子时，可以正常烧写，而且这块板子的3.3V和1.9V供电正常，JTAG管脚到芯片的连接正常，30M晶振正常起振，应该是硬件的原因导致的 ，但我查不出问题出在哪里，请教各位，谁能帮我解决这个问题，感激不尽
笨鸟：
主要电路重新焊接一遍，怀疑有虚焊或者短路的情况。
在使用xds100v2烧写28335的板子是，test connection 结果如下
[Start: Texas Instruments XDS100v2 USB Emulator_0]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
[Result]
—–[Print the board config pathname(s)]————————————
C:\Users\wuyichao\AppData\Local\TEXASI~1\
CCS\ccs6\0\0\BrdDat\testBoard.dat
—–[Print the reset-command software log-file]—————————–
This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'Mar 9 2014'.
The library build time was '22:27:48'.
The library package version is '5.1.450.0'.
The library component version is '35.34.40.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
—–[Print the reset-command hardware log-file]—————————–
The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).
—–[The log-file for the JTAG TCLK output generated from the PLL]———-
There is no hardware for programming the JTAG TCLK frequency.
—–[Measure the source and frequency of the final JTAG TCLKR input]——–
There is no hardware for measuring the JTAG TCLK frequency.
—–[Perform the standard path-length test on the JTAG IR and DR]———–
This path-length test uses blocks of 512 32-bit words.
The test for the JTAG IR instruction path-length failed.
The JTAG IR instruction scan-path is stuck-at-ones.
The test for the JTAG DR bypass path-length failed.
The JTAG DR bypass scan-path is stuck-at-ones.
—–[Perform the Integrity scan-test on the JTAG IR]————————
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted – 83.3 percent.
The JTAG IR Integrity scan-test has failed.
—–[Perform the Integrity scan-test on the JTAG DR]————————
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Test 1 Word 370: scanned out 0xFFFFFFFF and scanned in 0xFFFFFDFF.
Test 1 Word 371: scanned out 0xFFFFFFFF and scanned in 0xFEFFFFFF.
Test 1 Word 372: scanned out 0xFFFFFFFF and scanned in 0xFFCEFF7F.
Test 1 Word 373: scanned out 0xFFFFFFFF and scanned in 0xEFFEFAAF.
Test 1 Word 374: scanned out 0xFFFFFFFF and scanned in 0x76482B79.
Test 1 Word 375: scanned out 0xFFFFFFFF and scanned in 0xE918F739.
Test 1 Word 376: scanned out 0xFFFFFFFF and scanned in 0x917771C4.
Test 1 Word 377: scanned out 0xFFFFFFFF and scanned in 0x074CFA7B.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 2
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 3
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 4
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 5
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 6
Some of the values were corrupted – 80.1 percent.
The JTAG DR Integrity scan-test has failed.
[End: Texas Instruments XDS100v2 USB Emulator_0]
在使用另外一块同样设计的板子时，可以正常烧写，而且这块板子的3.3V和1.9V供电正常，JTAG管脚到芯片的连接正常，30M晶振正常起振，应该是硬件的原因导致的 ，但我查不出问题出在哪里，请教各位，谁能帮我解决这个问题，感激不尽
mangui zhang：
如果可以连接另外一块 那肯定是板卡硬件的问题
建议你看看clkout有没有时钟输出
接上JTAG后 对比一下相关引脚的电平
在使用xds100v2烧写28335的板子是，test connection 结果如下
[Start: Texas Instruments XDS100v2 USB Emulator_0]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
[Result]
—–[Print the board config pathname(s)]————————————
C:\Users\wuyichao\AppData\Local\TEXASI~1\
CCS\ccs6\0\0\BrdDat\testBoard.dat
—–[Print the reset-command software log-file]—————————–
This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'Mar 9 2014'.
The library build time was '22:27:48'.
The library package version is '5.1.450.0'.
The library component version is '35.34.40.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
—–[Print the reset-command hardware log-file]—————————–
The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).
—–[The log-file for the JTAG TCLK output generated from the PLL]———-
There is no hardware for programming the JTAG TCLK frequency.
—–[Measure the source and frequency of the final JTAG TCLKR input]——–
There is no hardware for measuring the JTAG TCLK frequency.
—–[Perform the standard path-length test on the JTAG IR and DR]———–
This path-length test uses blocks of 512 32-bit words.
The test for the JTAG IR instruction path-length failed.
The JTAG IR instruction scan-path is stuck-at-ones.
The test for the JTAG DR bypass path-length failed.
The JTAG DR bypass scan-path is stuck-at-ones.
—–[Perform the Integrity scan-test on the JTAG IR]————————
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted – 83.3 percent.
The JTAG IR Integrity scan-test has failed.
—–[Perform the Integrity scan-test on the JTAG DR]————————
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Test 1 Word 370: scanned out 0xFFFFFFFF and scanned in 0xFFFFFDFF.
Test 1 Word 371: scanned out 0xFFFFFFFF and scanned in 0xFEFFFFFF.
Test 1 Word 372: scanned out 0xFFFFFFFF and scanned in 0xFFCEFF7F.
Test 1 Word 373: scanned out 0xFFFFFFFF and scanned in 0xEFFEFAAF.
Test 1 Word 374: scanned out 0xFFFFFFFF and scanned in 0x76482B79.
Test 1 Word 375: scanned out 0xFFFFFFFF and scanned in 0xE918F739.
Test 1 Word 376: scanned out 0xFFFFFFFF and scanned in 0x917771C4.
Test 1 Word 377: scanned out 0xFFFFFFFF and scanned in 0x074CFA7B.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 2
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 3
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 4
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 5
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 6
Some of the values were corrupted – 80.1 percent.
The JTAG DR Integrity scan-test has failed.
[End: Texas Instruments XDS100v2 USB Emulator_0]
在使用另外一块同样设计的板子时，可以正常烧写，而且这块板子的3.3V和1.9V供电正常，JTAG管脚到芯片的连接正常，30M晶振正常起振，应该是硬件的原因导致的 ，但我查不出问题出在哪里，请教各位，谁能帮我解决这个问题，感激不尽
Martin Yu：
回复 mangui zhang:
建议从电源方面考虑，影响电源的方面：芯片焊接、周边电容、电感等。
