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C5535 仿真器连接故障

刚自己做了一块TMS32C5535的板子,因为是第一次接触DSP,调试的时候无法与仿真器通信,错误提示如下。但连接自检是通过的。

test connection 结果:

[Start]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

[Result]

—–[Print the board config pathname(s)]————————————

C:\Users\ADMINI~1\AppData\Local\.TI\2929362449\
0\0\BrdDat\testBoard.dat

—–[Print the reset-command software log-file]—————————–

This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'Apr 1 2013'.
The library build time was '23:55:08'.
The library package version is '5.1.73.0'.
The library component version is '35.34.40.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.

—–[Print the reset-command hardware log-file]—————————–

The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).

—–[The log-file for the JTAG TCLK output generated from the PLL]———-

There is no hardware for programming the JTAG TCLK frequency.

—–[Measure the source and frequency of the final JTAG TCLKR input]——–

There is no hardware for measuring the JTAG TCLK frequency.

—–[Perform the standard path-length test on the JTAG IR and DR]———–

This path-length test uses blocks of 512 32-bit words.

The test for the JTAG IR instruction path-length succeeded.
The JTAG IR instruction path-length is 4 bits.

The test for the JTAG DR bypass path-length succeeded.
The JTAG DR bypass path-length is 1 bits.

—–[Perform the Integrity scan-test on the JTAG IR]————————

This test will use blocks of 512 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.

The JTAG IR Integrity scan-test has succeeded.

—–[Perform the Integrity scan-test on the JTAG DR]————————

This test will use blocks of 512 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.

The JTAG DR Integrity scan-test has succeeded.

[End]

JTAG电路如下

Shine:

先确认一下target configuration file里是否选择了正确的仿真器驱动和device。

leach yao:

回复 Shine:

没有错,仿真器和device选择是对的

<?xml version="1.0" encoding="UTF-8" standalone="no"?><configurations XML_version="1.2" id="configurations_0">

<configuration XML_version="1.2" id="Texas Instruments XDS100v2 USB Emulator_0"> <instance XML_version="1.2" desc="Texas Instruments XDS100v2 USB Emulator_0" href="connections/TIXDS100v2_Connection.xml" id="Texas Instruments XDS100v2 USB Emulator_0" xml="TIXDS100v2_Connection.xml" xmlpath="connections"/> <connection XML_version="1.2" id="Texas Instruments XDS100v2 USB Emulator_0"> <instance XML_version="1.2" href="drivers/tixds100v2c55x.xml" id="drivers" xml="tixds100v2c55x.xml" xmlpath="drivers"/> <platform XML_version="1.2" id="platform_0"> <instance XML_version="1.2" desc="TMS320C5535_0" href="devices/c5535.xml" id="TMS320C5535_0" xml="c5535.xml" xmlpath="devices"/> <device HW_revision="1" XML_version="1.2" desc="TMS320C5535_0" description="TMS320C5535 16-bit Fixed point ultra low power DSP" id="TMS320C5535_0" partnum="TMS320C5535"/> </platform> </connection> </configuration></configurations>

Shine:

回复 leach yao:

有没有量过JTAG口的信号是否正确?

leach yao:

回复 Shine:

正确的JTAG口信号是怎么样呢

Shine:

回复 leach yao:

EMU0, EMU1高电平,TRST有一个低到高的变化。其他JTAG口管脚的时序见下面的手册第117页。5.7.18.1 JTAG Test_port Electrical Data and Timinghttp://www.ti.com/lit/ds/symlink/tms320c5535.pdf

 

leach yao:

回复 Shine:

电路测得:EMU0为高电平,EMU1为低电平。

调试仿真时JTAG上的时序如下,然后就报错。

Shine:

回复 leach yao:

EMU1应该也是高电平。

TRST一直是高电平吗?没有低到高的变化吗?

leach yao:

回复 Shine:

TRST有变化的,JTAG通信前有的低到高的变化,通信时都是高电平。TRST平时也都是高电平。

Shine:

回复 leach yao:

EMU1信号检查过没有?应该和EMU0一样是高电平。

leach yao:

回复 Shine:

EMU1一直是低电平

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