TI中文支持网开发环境采用Code Composer Studio Version: 6.0.1.00040芯片型号:XF28377DPTP,YFA-3BATZSW,G4
3.3V电源以及内核1.2V电源正常
使用XDS100V2仿真器 采用test connection 测试时 JTAG： TCLK TDI 输出信号正常，但TDO无信号脉冲；
并且有如下测试报告：
[Start: Texas Instruments XDS100v2 USB Emulator_0]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
[Result]
—–[Print the board config pathname(s)]————————————
C:\Users\cquwind\AppData\Local\TEXASI~1\
CCS\ti\0\0\BrdDat\testBoard.dat
—–[Print the reset-command software log-file]—————————–
This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'May 21 2014'.
The library build time was '17:19:59'.
The library package version is '5.1.507.0'.
The library component version is '35.34.40.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
—–[Print the reset-command hardware log-file]—————————–
The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).
—–[The log-file for the JTAG TCLK output generated from the PLL]———-
There is no hardware for programming the JTAG TCLK frequency.
—–[Measure the source and frequency of the final JTAG TCLKR input]——–
There is no hardware for measuring the JTAG TCLK frequency.
—–[Perform the standard path-length test on the JTAG IR and DR]———–
This path-length test uses blocks of 512 32-bit words.
The test for the JTAG IR instruction path-length failed.
The JTAG IR instruction scan-path is stuck-at-ones.
The test for the JTAG DR bypass path-length failed.
The JTAG DR bypass scan-path is stuck-at-ones.
—–[Perform the Integrity scan-test on the JTAG IR]————————
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0xFFFFFFC1.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 2
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 3
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 4
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 5
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 6
Some of the values were corrupted – 83.4 percent.
The JTAG IR Integrity scan-test has failed.
—–[Perform the Integrity scan-test on the JTAG DR]————————
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x0B99C02F.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 2
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 3
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 4
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 5
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 6
Some of the values were corrupted – 83.4 percent.
The JTAG DR Integrity scan-test has failed.
[End: Texas Instruments XDS100v2 USB Emulator_0]
烦请各位帮忙指点！
rookiecalf：
双核的配置是不是有问题？
开发环境采用Code Composer Studio Version: 6.0.1.00040芯片型号:XF28377DPTP,YFA-3BATZSW,G4
3.3V电源以及内核1.2V电源正常
使用XDS100V2仿真器 采用test connection 测试时 JTAG： TCLK TDI 输出信号正常，但TDO无信号脉冲；
并且有如下测试报告：
[Start: Texas Instruments XDS100v2 USB Emulator_0]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
[Result]
—–[Print the board config pathname(s)]————————————
C:\Users\cquwind\AppData\Local\TEXASI~1\
CCS\ti\0\0\BrdDat\testBoard.dat
—–[Print the reset-command software log-file]—————————–
This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'May 21 2014'.
The library build time was '17:19:59'.
The library package version is '5.1.507.0'.
The library component version is '35.34.40.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
—–[Print the reset-command hardware log-file]—————————–
The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).
—–[The log-file for the JTAG TCLK output generated from the PLL]———-
There is no hardware for programming the JTAG TCLK frequency.
—–[Measure the source and frequency of the final JTAG TCLKR input]——–
There is no hardware for measuring the JTAG TCLK frequency.
—–[Perform the standard path-length test on the JTAG IR and DR]———–
This path-length test uses blocks of 512 32-bit words.
The test for the JTAG IR instruction path-length failed.
The JTAG IR instruction scan-path is stuck-at-ones.
The test for the JTAG DR bypass path-length failed.
The JTAG DR bypass scan-path is stuck-at-ones.
—–[Perform the Integrity scan-test on the JTAG IR]————————
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0xFFFFFFC1.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 2
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 3
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 4
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 5
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 6
Some of the values were corrupted – 83.4 percent.
The JTAG IR Integrity scan-test has failed.
—–[Perform the Integrity scan-test on the JTAG DR]————————
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x0B99C02F.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 2
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 3
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 4
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 5
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 6
Some of the values were corrupted – 83.4 percent.
The JTAG DR Integrity scan-test has failed.
[End: Texas Instruments XDS100v2 USB Emulator_0]
烦请各位帮忙指点！
hongbiao du：
回复 rookiecalf:
空片子，买回来还没下程序，只用CCS6.0中的test connection进行联机测试就不行的。联机成功以后，通过下载程序才可以对双核进行配置吧。
开发环境采用Code Composer Studio Version: 6.0.1.00040芯片型号:XF28377DPTP,YFA-3BATZSW,G4
3.3V电源以及内核1.2V电源正常
使用XDS100V2仿真器 采用test connection 测试时 JTAG： TCLK TDI 输出信号正常，但TDO无信号脉冲；
并且有如下测试报告：
[Start: Texas Instruments XDS100v2 USB Emulator_0]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
[Result]
—–[Print the board config pathname(s)]————————————
C:\Users\cquwind\AppData\Local\TEXASI~1\
CCS\ti\0\0\BrdDat\testBoard.dat
—–[Print the reset-command software log-file]—————————–
This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'May 21 2014'.
The library build time was '17:19:59'.
The library package version is '5.1.507.0'.
The library component version is '35.34.40.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
—–[Print the reset-command hardware log-file]—————————–
The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).
—–[The log-file for the JTAG TCLK output generated from the PLL]———-
There is no hardware for programming the JTAG TCLK frequency.
—–[Measure the source and frequency of the final JTAG TCLKR input]——–
There is no hardware for measuring the JTAG TCLK frequency.
—–[Perform the standard path-length test on the JTAG IR and DR]———–
This path-length test uses blocks of 512 32-bit words.
The test for the JTAG IR instruction path-length failed.
The JTAG IR instruction scan-path is stuck-at-ones.
The test for the JTAG DR bypass path-length failed.
The JTAG DR bypass scan-path is stuck-at-ones.
—–[Perform the Integrity scan-test on the JTAG IR]————————
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0xFFFFFFC1.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 2
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 3
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 4
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 5
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 6
Some of the values were corrupted – 83.4 percent.
The JTAG IR Integrity scan-test has failed.
—–[Perform the Integrity scan-test on the JTAG DR]————————
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x0B99C02F.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 2
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 3
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 4
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 5
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 6
Some of the values were corrupted – 83.4 percent.
The JTAG DR Integrity scan-test has failed.
[End: Texas Instruments XDS100v2 USB Emulator_0]
烦请各位帮忙指点！
rookiecalf：
回复 hongbiao du:
hongbiao du
空片子，买回来还没下程序，只用CCS6.0中的test connection进行联机测试就不行的。联机成功以后，通过下载程序才可以对双核进行配置吧。
开发环境采用Code Composer Studio Version: 6.0.1.00040芯片型号:XF28377DPTP,YFA-3BATZSW,G4
3.3V电源以及内核1.2V电源正常
使用XDS100V2仿真器 采用test connection 测试时 JTAG： TCLK TDI 输出信号正常，但TDO无信号脉冲；
并且有如下测试报告：
[Start: Texas Instruments XDS100v2 USB Emulator_0]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
[Result]
—–[Print the board config pathname(s)]————————————
C:\Users\cquwind\AppData\Local\TEXASI~1\
CCS\ti\0\0\BrdDat\testBoard.dat
—–[Print the reset-command software log-file]—————————–
This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'May 21 2014'.
The library build time was '17:19:59'.
The library package version is '5.1.507.0'.
The library component version is '35.34.40.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
—–[Print the reset-command hardware log-file]—————————–
The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).
—–[The log-file for the JTAG TCLK output generated from the PLL]———-
There is no hardware for programming the JTAG TCLK frequency.
—–[Measure the source and frequency of the final JTAG TCLKR input]——–
There is no hardware for measuring the JTAG TCLK frequency.
—–[Perform the standard path-length test on the JTAG IR and DR]———–
This path-length test uses blocks of 512 32-bit words.
The test for the JTAG IR instruction path-length failed.
The JTAG IR instruction scan-path is stuck-at-ones.
The test for the JTAG DR bypass path-length failed.
The JTAG DR bypass scan-path is stuck-at-ones.
—–[Perform the Integrity scan-test on the JTAG IR]————————
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0xFFFFFFC1.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 2
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 3
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 4
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 5
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 6
Some of the values were corrupted – 83.4 percent.
The JTAG IR Integrity scan-test has failed.
—–[Perform the Integrity scan-test on the JTAG DR]————————
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x0B99C02F.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 2
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 3
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 4
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 5
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 6
Some of the values were corrupted – 83.4 percent.
The JTAG DR Integrity scan-test has failed.
[End: Texas Instruments XDS100v2 USB Emulator_0]
烦请各位帮忙指点！
hongbiao du：
回复 rookiecalf:
目标板怎么设置，还请指教。
由于无法联机从软件上我是没办法对CPU操作的。
开发环境采用Code Composer Studio Version: 6.0.1.00040芯片型号:XF28377DPTP,YFA-3BATZSW,G4
3.3V电源以及内核1.2V电源正常
使用XDS100V2仿真器 采用test connection 测试时 JTAG： TCLK TDI 输出信号正常，但TDO无信号脉冲；
并且有如下测试报告：
[Start: Texas Instruments XDS100v2 USB Emulator_0]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
[Result]
—–[Print the board config pathname(s)]————————————
C:\Users\cquwind\AppData\Local\TEXASI~1\
CCS\ti\0\0\BrdDat\testBoard.dat
—–[Print the reset-command software log-file]—————————–
This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'May 21 2014'.
The library build time was '17:19:59'.
The library package version is '5.1.507.0'.
The library component version is '35.34.40.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
—–[Print the reset-command hardware log-file]—————————–
The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).
—–[The log-file for the JTAG TCLK output generated from the PLL]———-
There is no hardware for programming the JTAG TCLK frequency.
—–[Measure the source and frequency of the final JTAG TCLKR input]——–
There is no hardware for measuring the JTAG TCLK frequency.
—–[Perform the standard path-length test on the JTAG IR and DR]———–
This path-length test uses blocks of 512 32-bit words.
The test for the JTAG IR instruction path-length failed.
The JTAG IR instruction scan-path is stuck-at-ones.
The test for the JTAG DR bypass path-length failed.
The JTAG DR bypass scan-path is stuck-at-ones.
—–[Perform the Integrity scan-test on the JTAG IR]————————
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0xFFFFFFC1.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 2
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 3
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 4
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 5
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 6
Some of the values were corrupted – 83.4 percent.
The JTAG IR Integrity scan-test has failed.
—–[Perform the Integrity scan-test on the JTAG DR]————————
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x0B99C02F.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 2
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 3
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 4
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 5
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 6
Some of the values were corrupted – 83.4 percent.
The JTAG DR Integrity scan-test has failed.
[End: Texas Instruments XDS100v2 USB Emulator_0]
烦请各位帮忙指点！
rookiecalf：
回复 hongbiao du:
hongbiao du
目标板怎么设置，还请指教。
由于无法联机从软件上我是没办法对CPU操作的。
开发环境采用Code Composer Studio Version: 6.0.1.00040芯片型号:XF28377DPTP,YFA-3BATZSW,G4
3.3V电源以及内核1.2V电源正常
使用XDS100V2仿真器 采用test connection 测试时 JTAG： TCLK TDI 输出信号正常，但TDO无信号脉冲；
并且有如下测试报告：
[Start: Texas Instruments XDS100v2 USB Emulator_0]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
[Result]
—–[Print the board config pathname(s)]————————————
C:\Users\cquwind\AppData\Local\TEXASI~1\
CCS\ti\0\0\BrdDat\testBoard.dat
—–[Print the reset-command software log-file]—————————–
This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'May 21 2014'.
The library build time was '17:19:59'.
The library package version is '5.1.507.0'.
The library component version is '35.34.40.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
—–[Print the reset-command hardware log-file]—————————–
The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).
—–[The log-file for the JTAG TCLK output generated from the PLL]———-
There is no hardware for programming the JTAG TCLK frequency.
—–[Measure the source and frequency of the final JTAG TCLKR input]——–
There is no hardware for measuring the JTAG TCLK frequency.
—–[Perform the standard path-length test on the JTAG IR and DR]———–
This path-length test uses blocks of 512 32-bit words.
The test for the JTAG IR instruction path-length failed.
The JTAG IR instruction scan-path is stuck-at-ones.
The test for the JTAG DR bypass path-length failed.
The JTAG DR bypass scan-path is stuck-at-ones.
—–[Perform the Integrity scan-test on the JTAG IR]————————
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0xFFFFFFC1.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 2
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 3
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 4
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 5
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 6
Some of the values were corrupted – 83.4 percent.
The JTAG IR Integrity scan-test has failed.
—–[Perform the Integrity scan-test on the JTAG DR]————————
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x0B99C02F.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 2
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 3
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 4
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 5
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 6
Some of the values were corrupted – 83.4 percent.
The JTAG DR Integrity scan-test has failed.
[End: Texas Instruments XDS100v2 USB Emulator_0]
烦请各位帮忙指点！
hongbiao du：
回复 rookiecalf:
target confifuration 我是按默认的，这地方需要特殊设置吗？
开发环境采用Code Composer Studio Version: 6.0.1.00040芯片型号:XF28377DPTP,YFA-3BATZSW,G4
3.3V电源以及内核1.2V电源正常
使用XDS100V2仿真器 采用test connection 测试时 JTAG： TCLK TDI 输出信号正常，但TDO无信号脉冲；
并且有如下测试报告：
[Start: Texas Instruments XDS100v2 USB Emulator_0]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
[Result]
—–[Print the board config pathname(s)]————————————
C:\Users\cquwind\AppData\Local\TEXASI~1\
CCS\ti\0\0\BrdDat\testBoard.dat
—–[Print the reset-command software log-file]—————————–
This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'May 21 2014'.
The library build time was '17:19:59'.
The library package version is '5.1.507.0'.
The library component version is '35.34.40.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
—–[Print the reset-command hardware log-file]—————————–
The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).
—–[The log-file for the JTAG TCLK output generated from the PLL]———-
There is no hardware for programming the JTAG TCLK frequency.
—–[Measure the source and frequency of the final JTAG TCLKR input]——–
There is no hardware for measuring the JTAG TCLK frequency.
—–[Perform the standard path-length test on the JTAG IR and DR]———–
This path-length test uses blocks of 512 32-bit words.
The test for the JTAG IR instruction path-length failed.
The JTAG IR instruction scan-path is stuck-at-ones.
The test for the JTAG DR bypass path-length failed.
The JTAG DR bypass scan-path is stuck-at-ones.
—–[Perform the Integrity scan-test on the JTAG IR]————————
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0xFFFFFFC1.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 2
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 3
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 4
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 5
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 6
Some of the values were corrupted – 83.4 percent.
The JTAG IR Integrity scan-test has failed.
—–[Perform the Integrity scan-test on the JTAG DR]————————
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x0B99C02F.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 2
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 3
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 4
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 5
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 6
Some of the values were corrupted – 83.4 percent.
The JTAG DR Integrity scan-test has failed.
[End: Texas Instruments XDS100v2 USB Emulator_0]
烦请各位帮忙指点！
rookiecalf：
回复 hongbiao du:
hongbiao du
target confifuration 我是按默认的，这地方需要特殊设置吗？
开发环境采用Code Composer Studio Version: 6.0.1.00040芯片型号:XF28377DPTP,YFA-3BATZSW,G4
3.3V电源以及内核1.2V电源正常
使用XDS100V2仿真器 采用test connection 测试时 JTAG： TCLK TDI 输出信号正常，但TDO无信号脉冲；
并且有如下测试报告：
[Start: Texas Instruments XDS100v2 USB Emulator_0]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
[Result]
—–[Print the board config pathname(s)]————————————
C:\Users\cquwind\AppData\Local\TEXASI~1\
CCS\ti\0\0\BrdDat\testBoard.dat
—–[Print the reset-command software log-file]—————————–
This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'May 21 2014'.
The library build time was '17:19:59'.
The library package version is '5.1.507.0'.
The library component version is '35.34.40.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
—–[Print the reset-command hardware log-file]—————————–
The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).
—–[The log-file for the JTAG TCLK output generated from the PLL]———-
There is no hardware for programming the JTAG TCLK frequency.
—–[Measure the source and frequency of the final JTAG TCLKR input]——–
There is no hardware for measuring the JTAG TCLK frequency.
—–[Perform the standard path-length test on the JTAG IR and DR]———–
This path-length test uses blocks of 512 32-bit words.
The test for the JTAG IR instruction path-length failed.
The JTAG IR instruction scan-path is stuck-at-ones.
The test for the JTAG DR bypass path-length failed.
The JTAG DR bypass scan-path is stuck-at-ones.
—–[Perform the Integrity scan-test on the JTAG IR]————————
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0xFFFFFFC1.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 2
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 3
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 4
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 5
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 6
Some of the values were corrupted – 83.4 percent.
The JTAG IR Integrity scan-test has failed.
—–[Perform the Integrity scan-test on the JTAG DR]————————
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x0B99C02F.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 2
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 3
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 4
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 5
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 6
Some of the values were corrupted – 83.4 percent.
The JTAG DR Integrity scan-test has failed.
[End: Texas Instruments XDS100v2 USB Emulator_0]
烦请各位帮忙指点！
hongbiao du：
回复 rookiecalf:
这是我的target congiguration默认配置
开发环境采用Code Composer Studio Version: 6.0.1.00040芯片型号:XF28377DPTP,YFA-3BATZSW,G4
3.3V电源以及内核1.2V电源正常
使用XDS100V2仿真器 采用test connection 测试时 JTAG： TCLK TDI 输出信号正常，但TDO无信号脉冲；
并且有如下测试报告：
[Start: Texas Instruments XDS100v2 USB Emulator_0]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
[Result]
—–[Print the board config pathname(s)]————————————
C:\Users\cquwind\AppData\Local\TEXASI~1\
CCS\ti\0\0\BrdDat\testBoard.dat
—–[Print the reset-command software log-file]—————————–
This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'May 21 2014'.
The library build time was '17:19:59'.
The library package version is '5.1.507.0'.
The library component version is '35.34.40.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
—–[Print the reset-command hardware log-file]—————————–
The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).
—–[The log-file for the JTAG TCLK output generated from the PLL]———-
There is no hardware for programming the JTAG TCLK frequency.
—–[Measure the source and frequency of the final JTAG TCLKR input]——–
There is no hardware for measuring the JTAG TCLK frequency.
—–[Perform the standard path-length test on the JTAG IR and DR]———–
This path-length test uses blocks of 512 32-bit words.
The test for the JTAG IR instruction path-length failed.
The JTAG IR instruction scan-path is stuck-at-ones.
The test for the JTAG DR bypass path-length failed.
The JTAG DR bypass scan-path is stuck-at-ones.
—–[Perform the Integrity scan-test on the JTAG IR]————————
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0xFFFFFFC1.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 2
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 3
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 4
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 5
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 6
Some of the values were corrupted – 83.4 percent.
The JTAG IR Integrity scan-test has failed.
—–[Perform the Integrity scan-test on the JTAG DR]————————
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x0B99C02F.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 2
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 3
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 4
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 5
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 6
Some of the values were corrupted – 83.4 percent.
The JTAG DR Integrity scan-test has failed.
[End: Texas Instruments XDS100v2 USB Emulator_0]
烦请各位帮忙指点！
rookiecalf：
回复 hongbiao du:
没配置过，但应该没有问题啊，你是不是再看看硬件有没有BUG
