JTAG调试时，仿真器连接不上线路板-TI中文支持网

各位：

我目前使用的是CCS5.5.0的90天全功能试用版本和TI原厂的XDS200仿真器，给TI的开发板下载和调试程序都正常，但是在给自己的线路板下载程序的时候，在配置完 .ccxml文件之后点击“Test Connection”时出现以下报错：

This error is generated by TI's USCIF driver or utilities.
The value is '-233'(0xffffff17)
The title is 'SC_ERR_PATH_BROKEN'.

The explanation is:

The JTAG IR and DR scan-paths cannot circulate bits,they may be broken.

An attempt to scan the JTAG scan-path has failed.

The target's JTAG scan-path appears to be broken with a stuck-at-ones or stuck-at-zero fault.

JTAG部分的设计原理图如下，请问该如何解决这个问题？谢谢。

rookiecalf：

原理图没问题的话，再看看连接是否可靠，有没有什么地方连接是虚的

各位：

This error is generated by TI's USCIF driver or utilities.
The value is '-233'(0xffffff17)
The title is 'SC_ERR_PATH_BROKEN'.

The explanation is:

The JTAG IR and DR scan-paths cannot circulate bits,they may be broken.

An attempt to scan the JTAG scan-path has failed.

The target's JTAG scan-path appears to be broken with a stuck-at-ones or stuck-at-zero fault.

JTAG部分的设计原理图如下，请问该如何解决这个问题？谢谢。

Eric Ma：

回复 rookiecalf:

检查一下芯片供电有没问题。焊接有没问题。尤其是JTAG口。

ERIC

各位：

This error is generated by TI's USCIF driver or utilities.
The value is '-233'(0xffffff17)
The title is 'SC_ERR_PATH_BROKEN'.

The explanation is:

The JTAG IR and DR scan-paths cannot circulate bits,they may be broken.

An attempt to scan the JTAG scan-path has failed.

The target's JTAG scan-path appears to be broken with a stuck-at-ones or stuck-at-zero fault.

JTAG部分的设计原理图如下，请问该如何解决这个问题？谢谢。

wentao zhang：请问你解决问题了吗

各位：

This error is generated by TI's USCIF driver or utilities.
The value is '-233'(0xffffff17)
The title is 'SC_ERR_PATH_BROKEN'.

The explanation is:

The JTAG IR and DR scan-paths cannot circulate bits,they may be broken.

An attempt to scan the JTAG scan-path has failed.

The target's JTAG scan-path appears to be broken with a stuck-at-ones or stuck-at-zero fault.

JTAG部分的设计原理图如下，请问该如何解决这个问题？谢谢。

mangui zhang：是不是一个JTAG上连接了两个MCU不是板载的仿真器吧

JTAG调试时，仿真器连接不上线路板