TI中文支持网板子上带有tms570ls20216和tms570LC4357，调试都遇到问题
遇到过的给指点一下吧，电源晶振都正常，实在不知道去哪里找问题了，
20216debug的时候报错
CortexR4: Flash Programmer: Error erasing Bank 0, Sector 0. Operation Cancelled.
4357接jtag调试时，xds100v2那的测试不能通过报错
The test for the JTAG IR instruction path-length failed.
The JTAG IR instruction scan-path is stuck-at-zero.
The test for the JTAG DR bypass path-length failed.
The JTAG DR bypass scan-path is stuck-at-zero.
Do a test using 0xFFFFFFFF.
Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 1: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 2: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 3: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 4: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 5: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 6: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 7: scanned out 0xFFFFFFFF and scanned in 0x00000000.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted – 83.3 percent.
The JTAG IR Integrity scan-test has failed.
—–[Perform the Integrity scan-test on the JTAG DR]————————
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 1: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 2: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 3: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 4: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 5: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 6: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 7: scanned out 0xFFFFFFFF and scanned in 0x00000000.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted – 83.3 percent.
The JTAG DR Integrity scan-test has failed.
[End: Texas Instruments XDS100v2 USB Emulator_0]
gaoyang9992006：
图片显示驱动不对
gaoyang9992006：
楼主用的哪个版本的CCS？？有人说换个新版本就好了。http://bbs.eeworld.com.cn/thread-370895-1-1.html
gaoyang9992006：
http://forum.eepw.com.cn/thread/241041/1
这个帖子好像也是说这个问题的，估计是你驱动哪儿没有弄好。
Ken Wang：
麻烦问一下，你们是做什么项目的？现在比较少用到LC4357的双核产品嘛。
系统是自己设计的？方便看下JTAG部分的设计电路吗？另外CCS的版本是多少？
你遇到的问题，需要结合硬件来分析。
谢谢
ZYN：
回复 Ken Wang:
具体做什么项目我也不是很清楚，我们这次主要是做下测试
在E2e上找到个帖子发现原理图上20216的vccp的供电有问题有问题，改过来之后有两个板子好了，但是有时候还是有问题的，怀疑是复位的问题；另外上电之后20216会发热，不知道哪里的问题
4357的调试电路如附件，请帮忙看看多谢，ccs用的6.0。
ZYN：
回复 gaoyang9992006:
多谢您的提示，我再看看
ZYN：
回复 gaoyang9992006:
ccs6.0，新版本是多少了？
Ken Wang：
回复 ZYN:
你的图片看的不清楚，你可以借鉴下面链接里面的launchpad的参考设计原理图，比对一下你的设计。
最新的CCSV6应该是6.1. 你可以确定一下你的6.0里面支不支持LC43X产品。
谢谢
ZYN：
回复 Ken Wang:
用的ccs6.0里支持LC43x的。
应该是原理图里复位电路有问题，这块他没有参考launchpad的原理图，但是也不确定，能给个邮箱发给您看下么？原理图是另外的人做的，不方便直接发。
