TI中文支持网1、应用时采用电池供电，在应用AD采样的功耗比较大，如何降低功耗？
2、芯片IO口在芯片上电过程的电平，调试仿真时出现电平不确定的情况，能否描
述下IO在上电过程中的电平？
Susan Yang：
关于ADC采样的功耗问题，我们是有一个相关文档的（利用 MSP430FR MCU 片上 VREF 和 ADC 实现低功耗电池电压测量）
www.ti.com/…/zhca767.pdf
Susan Yang：
关于问题2，能否请您详细描述一下？
MSP430FR是有一个PMM的，您可以看一下 www.ti.com.cn/…/slau367o.pdf
2.2.8 Port I/O Control
The PMM provides a means of ensuring that I/O pins cannot behave in uncontrolled fashion during an undervoltage event. During these times, outputs are disabled, both normal drive and the weak pullup or pulldown function. If the CPU is functioning normally, and then an undervoltage event occurs, any pin configured as an input has its PxIN register value locked in at the point the event occurs, until voltage is restored. During the undervoltage event, external voltage changes on the pin are not registered internally. This helps prevent erratic behavior from occurring.
灰小子：
在上电过程中，io是输入状态，电平高低受外部电路影响，悬空的受周围电磁环境影响。
