CC1310: smartrf studio和flash programmer无法识别设备

在使用网购的XDS110仿真器连接设备后，使用4线cJTAG和JTAG的情况下smartrf studio和flash programmer能识别到仿真器，但无法识别到cc1310设备。  
想请问一下是什么原因呢？

但是ccs能正常调试和下载，以下为test connection的结果：

[Start: Texas Instruments XDS110 USB Debug Probe]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity

[Result]

—–[Print the board config pathname(s)]————————————

C:\Users\ADMINI~1\AppData\Local\TEXASI~1\
CCS\ccs1230\0\0\BrdDat\testBoard.dat

—–[Print the reset-command software log-file]—————————–

This utility has selected a 100/110/510 class product.
This utility will load the adapter 'jioxds110.dll'.
The library build date was 'Mar 10 2023'.
The library build time was '17:27:27'.
The library package version is '9.11.0.00128'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '5' (0x00000005).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.

—–[Print the reset-command hardware log-file]—————————–

The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the XDS110 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for XDS110 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).

—–[Perform the Integrity scan-test on the JTAG IR]————————

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.

The JTAG IR Integrity scan-test has succeeded.

—–[Perform the Integrity scan-test on the JTAG DR]————————

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.

The JTAG DR Integrity scan-test has succeeded.

[End: Texas Instruments XDS110 USB Debug Probe]

Yolande Wang：

您好，

错误消息提示了几个可能的问题：

可以先检查调试器和目标设备之间的物理连接是否正确。

再尝试使用uniflash擦除整个闪存：

这是恢复锁定设备的方法，工具链接是：www.ti.com/…/UNIFLASH

,

? ?：

你好，我尝试了一下在uniflash中也无法识别到。

我试着使用了jlink擦除整片芯片的数据后重新使用XDS110连接，但依旧无法识别。CCS仍能正常连接，调试，下载。

（xds110商家提供的消息为不支持两线cjtag，但支持4线，CCS中测试4线cJTAG和普通JTAG均能正常识别）

,

Yolande Wang：

驱动卸载重装一下试试。

查看 XDS110 debug ： https://software-dl.ti.com/ccs/esd/documents/xdsdebugprobes/emu_xds110.html