LAUNCHXL-F280039C: XDS110 test connection fail

test connect xds110 fail.

[Start: Texas Instruments XDS110 USB Debug Probe_0]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity

[Result]

—–[Print the board config pathname(s)]————————————

C:\Users\HZYD022\AppData\Local\TEXASI~1\
CCS\ccs1110\0\0\BrdDat\testBoard.dat

—–[Print the reset-command software log-file]—————————–

This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioxds110.dll'.
The library build date was 'Dec 8 2021'.
The library build time was '11:16:32'.
The library package version is '9.6.0.00172'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '5' (0x00000005).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.

—–[Print the reset-command hardware log-file]—————————–

The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the XDS110 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for XDS110 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).

—–[Perform the Integrity scan-test on the JTAG IR]————————

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Test 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0x00000000.
Test 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0x00000000.
Test 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0x00000000.
Test 3 Word 3: scanned out 0xFE03E0E2 and scanned in 0x00000000.
Test 3 Word 4: scanned out 0xFE03E0E2 and scanned in 0x00000000.
Test 3 Word 5: scanned out 0xFE03E0E2 and scanned in 0x00000000.
Test 3 Word 6: scanned out 0xFE03E0E2 and scanned in 0x00000000.
Test 3 Word 7: scanned out 0xFE03E0E2 and scanned in 0x00000000.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 3, skipped: 0, failed: 1
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 2
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 3
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 4
Some of the values were corrupted – 66.7 percent.

The JTAG IR Integrity scan-test has failed.

—–[Perform the Integrity scan-test on the JTAG DR]————————

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Test 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0x00000000.
Test 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0x00000080.
Test 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0x00000000.
Test 3 Word 3: scanned out 0xFE03E0E2 and scanned in 0x00000000.
Test 3 Word 4: scanned out 0xFE03E0E2 and scanned in 0xFC000000.
Test 3 Word 5: scanned out 0xFE03E0E2 and scanned in 0x00000000.
Test 3 Word 6: scanned out 0xFE03E0E2 and scanned in 0x00000000.
Test 3 Word 7: scanned out 0xFE03E0E2 and scanned in 0x00000080.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 3, skipped: 0, failed: 1
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 1
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 2
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 3
Some of the values were corrupted – 48.4 percent.

The JTAG DR Integrity scan-test has failed.

[End: Texas Instruments XDS110 USB Debug Probe_0]

Yale Li：

是对F280039C LaunchPad上的板载XDS110做的测试吗？

之前有正常使用过吗？

,

Fred：

是在板载XDS110做的测试，第一次在上面测试，之前没用过

,

Fred：

现在可以工作了，根据你们在线帮助的反馈，需要电阻器 R44 和 R45 进行连接

,

Yale Li：

问题解决就好

Fred 说：根据你们在线帮助的反馈，

方便把参考内容以及源帖在这里吗？

,

Fred：

C2000 F28003x 系列 LaunchPad 开发套件 (ti.com.cn) 这个链接的下面的章节

,

Yale Li：

感谢分享~