Part Number:TMS320F280025
1.测试板JTAG原理图
备注:使用万用表测试引脚均为导通状态,芯片供电正常
2.提示错误如下:
[Start: Texas Instruments XDS100v3 USB Debug Probe_0]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
[Result]
—–[Print the board config pathname(s)]————————————
C:\Users\admin\AppData\Local\TEXASI~1\CCS\
ccs1200\0\0\BrdDat\testBoard.dat
—–[Print the reset-command software log-file]—————————–
This utility has selected a 100/110/510 class product.
This utility will load the adapter 'jioserdesusbv3.dll'.
The library build date was 'Jun 17 2022'.
The library build time was '22:30:41'.
The library package version is '9.8.0.00235'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
—–[Print the reset-command hardware log-file]—————————–
The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).
An error occurred while hard opening the controller.
—–[An error has occurred and this utility has aborted]——————–
This error is generated by TI's USCIF driver or utilities.
The value is '-233' (0xffffff17).
The title is 'SC_ERR_PATH_BROKEN'.
The explanation is:
The JTAG IR and DR scan-paths cannot circulate bits, they may be broken.
An attempt to scan the JTAG scan-path has failed.
The target's JTAG scan-path appears to be broken
with a stuck-at-ones or stuck-at-zero fault.
[End: Texas Instruments XDS100v3 USB Debug Probe_0]
Yale Li:
您好,请联系该仿真器的设计商,您会获得更好的支持