TI中文支持网Part Number:TMS320F28388DOther Parts Discussed in Thread:C2000WARE
如题，开发项目时我尝试了使用两款不同的XDS110仿真器（如下图），我保证了2个测试条件都是一致的情况下：
图中1号仿真器能通过连接测试并且烧录成功，图中2号仿真器却不能通过连接测试出现报错（如下面报错内容），并且期间亮红灯闪烁；另外我多尝试了一个新的2号仿真器也是一样的现象，所以仿真器应该都是好的
开发环境：CCS12.0、C2000Ware_4_01_00_00、两款新买的XDS110仿真器和TI官网的开发板
希望能告知解决方法和查找问题的测试方法，谢谢！
两款XDS110实物图片：
仿真器2连接报错内容：
[Start: Texas Instruments XDS110 USB Debug Probe_0]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity
[Result]
—–[Print the board config pathname(s)]————————————
C:\Users\022800~1\AppData\Local\TEXASI~1\
CCS\ccs1200\0\0\BrdDat\testBoard.dat
—–[Print the reset-command software log-file]—————————–
This utility has selected a 100/110/510 class product.
This utility will load the adapter 'jioxds110.dll'.
The library build date was 'Jun 17 2022'.
The library build time was '22:30:41'.
The library package version is '9.8.0.00235'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '5' (0x00000005).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
—–[Print the reset-command hardware log-file]—————————–
The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the XDS110 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for XDS110 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).
—–[An error has occurred and this utility has aborted]——————–
This error is generated by TI's USCIF driver or utilities.
The value is '-233' (0xffffff17).
The title is 'SC_ERR_PATH_BROKEN'.
The explanation is:
The JTAG IR and DR scan-paths cannot circulate bits, they may be broken.
An attempt to scan the JTAG scan-path has failed.
The target's JTAG scan-path appears to be broken
with a stuck-at-ones or stuck-at-zero fault.
[End: Texas Instruments XDS110 USB Debug Probe_0]
另外我查看了两款仿真器电脑端口的识别，也是正确识别驱动如下图：
Yale Li：
您好，您的仿真器在哪里买的？
‘-233’可能是连接问题，请检查硬件连接
,
Klay Klay：
仿真器是公司提供的，硬件连接是正确，确定没有接反之类的情况
,
Yale Li：
您好，您的1号仿真器是TI的TMDSEMU110-U，2号仿真器并不是TI生产制造的，里面的设计细节可能会有所不同。您去找它实际的生产厂商可能会得到更好的支持。
我说的硬件连接是指仿真器内部的硬件连接。
请注意报错内容：
Klay Klay 说：
The value is '-233' (0xffffff17).The title is 'SC_ERR_PATH_BROKEN'.
The explanation is:The JTAG IR and DR scan-paths cannot circulate bits, they may be broken.An attempt to scan the JTAG scan-path has failed.The target's JTAG scan-path appears to be brokenwith a stuck-at-ones or stuck-at-zero fault.
DR(Data Register)和IR(Instruction Register)的扫描路径有问题，而这个问题首先应该检查硬件问题。
下面这几个帖子基本都是类似的问题：
MSP432E401Y: Error: The value is '-233' (0xffffff17). The title is 'SC_ERR_PATH_BROKEN'.
Compiler: error code " The value is '-233' (0xffffff17)" for F28069 chip via Jtag
SC_ERR_PATH_BROKEN-233 error
这个页面对类似的问题做了一个小结：
Invalid data read back
根据我上面发的第三个链接SC_ERR_PATH_BROKEN-233 error中的叙述，这个问题也有可能是MCU损坏了。但是按照您的叙述，用1号仿真器可以成功烧录，所以能够排除这个原因。
Klay Klay 说：另外我多尝试了一个新的2号仿真器也是一样的现象，所以仿真器应该都是好的
我认为并不能得出这样的结论，这种仿真器是很容易出问题的。
,
Klay Klay：
了解，感谢你的回答
,
Yale Li：
不客气，希望您能成功解决问题
