TI中文支持网Part Number:TMS570LC4357
实验室基于TMS570LC4357，有一块自己设计的板子，使用的下载器是 Blackhawk USB100v2 ，如下图：
在CCS中新建工程时，找不到相应的下载器：
是安装CCS时不完整吗，去哪儿下载完整（重装CCS太麻烦了）？
Green Deng：
你好，我看了一下我这边的CCS（仿真器部分完整安装），也没有这款仿真器。随后我搜索了一下论坛资料，有工程师提到可以选择TI通用XDS100 V2仿真器，你可以测试一下。
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user6445572：
你好，按照这个设置，连好下载器上电后，在ccxml文件里点击“test connect”失败，报错信息如下：
[Start: Texas Instruments XDS100v2 USB Debug Probe_0]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
[Result]
—–[Print the board config pathname(s)]————————————
C:\Users\xuew\AppData\Local\TEXASI~1\CCS\ CCS111~1.0\0\0\BrdDat\testBoard.dat
—–[Print the reset-command software log-file]—————————–
This utility has selected a 100- or 510-class product.This utility will load the adapter 'jioserdesusb.dll'.The library build date was 'Dec 8 2021'.The library build time was '11:16:32'.The library package version is '9.6.0.00172'.The library component version is '35.35.0.0'.The controller does not use a programmable FPGA.The controller has a version number of '4' (0x00000004).The controller has an insertion length of '0' (0x00000000).This utility will attempt to reset the controller.This utility has successfully reset the controller.
—–[Print the reset-command hardware log-file]—————————–
The scan-path will be reset by toggling the JTAG TRST signal.The controller is the FTDI FT2232 with USB interface.The link from controller to target is direct (without cable).The software is configured for FTDI FT2232 features.The controller cannot monitor the value on the EMU[0] pin.The controller cannot monitor the value on the EMU[1] pin.The controller cannot control the timing on output pins.The controller cannot control the timing on input pins.The scan-path link-delay has been set to exactly '0' (0x0000).
—–[The log-file for the JTAG TCLK output generated from the PLL]———-
There is no hardware for programming the JTAG TCLK frequency.
—–[Measure the source and frequency of the final JTAG TCLKR input]——–
There is no hardware for measuring the JTAG TCLK frequency.
—–[Perform the standard path-length test on the JTAG IR and DR]———–
This path-length test uses blocks of 64 32-bit words.
The test for the JTAG IR instruction path-length failed.The JTAG IR instruction scan-path is stuck-at-zero.
The test for the JTAG DR bypass path-length failed.The JTAG DR bypass scan-path is stuck-at-zero.
—–[Perform the Integrity scan-test on the JTAG IR]————————
This test will use blocks of 64 32-bit words.This test will be applied just once.
Do a test using 0xFFFFFFFF.Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x00000000.Test 1 Word 1: scanned out 0xFFFFFFFF and scanned in 0x00000000.Test 1 Word 2: scanned out 0xFFFFFFFF and scanned in 0x00000000.Test 1 Word 3: scanned out 0xFFFFFFFF and scanned in 0x00000000.Test 1 Word 4: scanned out 0xFFFFFFFF and scanned in 0x00000000.Test 1 Word 5: scanned out 0xFFFFFFFF and scanned in 0x00000000.Test 1 Word 6: scanned out 0xFFFFFFFF and scanned in 0x00000000.Test 1 Word 7: scanned out 0xFFFFFFFF and scanned in 0x00000000.The details of the first 8 errors have been provided.The utility will now report only the count of failed tests.Scan tests: 1, skipped: 0, failed: 1Do a test using 0x00000000.Scan tests: 2, skipped: 0, failed: 1Do a test using 0xFE03E0E2.Scan tests: 3, skipped: 0, failed: 2Do a test using 0x01FC1F1D.Scan tests: 4, skipped: 0, failed: 3Do a test using 0x5533CCAA.Scan tests: 5, skipped: 0, failed: 4Do a test using 0xAACC3355.Scan tests: 6, skipped: 0, failed: 5Some of the values were corrupted – 83.3 percent.
The JTAG IR Integrity scan-test has failed.
—–[Perform the Integrity scan-test on the JTAG DR]————————
This test will use blocks of 64 32-bit words.This test will be applied just once.
Do a test using 0xFFFFFFFF.Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x00000000.Test 1 Word 1: scanned out 0xFFFFFFFF and scanned in 0x00000000.Test 1 Word 2: scanned out 0xFFFFFFFF and scanned in 0x00000000.Test 1 Word 3: scanned out 0xFFFFFFFF and scanned in 0x00000000.Test 1 Word 4: scanned out 0xFFFFFFFF and scanned in 0x00000000.Test 1 Word 5: scanned out 0xFFFFFFFF and scanned in 0x00000000.Test 1 Word 6: scanned out 0xFFFFFFFF and scanned in 0x00000000.Test 1 Word 7: scanned out 0xFFFFFFFF and scanned in 0x00000000.The details of the first 8 errors have been provided.The utility will now report only the count of failed tests.Scan tests: 1, skipped: 0, failed: 1Do a test using 0x00000000.Scan tests: 2, skipped: 0, failed: 1Do a test using 0xFE03E0E2.Scan tests: 3, skipped: 0, failed: 2Do a test using 0x01FC1F1D.Scan tests: 4, skipped: 0, failed: 3Do a test using 0x5533CCAA.Scan tests: 5, skipped: 0, failed: 4Do a test using 0xAACC3355.Scan tests: 6, skipped: 0, failed: 5Some of the values were corrupted – 83.3 percent.
The JTAG DR Integrity scan-test has failed.
[End: Texas Instruments XDS100v2 USB Debug Probe_0]
看不太懂，要怎么检查？
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Green Deng：
额，这似乎就是目标设备不对，我这边没这款仿真器，也没找到什么官方资料介绍这款仿真器的。
不行了你把上面显示的几款比较接近的都试一下看能否连接。另外你可以下载Uniflash，试一下自动发现设备，看能否识别出可用的设备来
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user6445572：
打开uiflash后，首先能自动识别到下载器类型：
然后把.out文件烧进去时报下面错误：
[ERROR] IcePick: Error connecting to the target: (Error -2131 @ 0x0) Unable to access device register. Reset the device, and retry the operation. If error persists, confirm configuration, power-cycle the board, and/or try more reliable JTAG settings (e.g. lower TCLK). (Emulation package 9.6.0.00172)
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Green Deng：
这个。。。你有没有试过用其他仿真器能否正常连接？
