TI中文支持网Part Number:TMS320F28377DOther Parts Discussed in Thread:C2000WARE
仿真器为XDS100V2，已成功连接过多次。但几天前突然连接失败，错误信息为Error -2131。失败后换了别的仿真器，错误信息相同。重启电脑和CCS都试过。在某一次重启CCS后莫名其妙地连接成功了。
然后今天又出现了连接失败的现象，错误信息和之前的相同。反复重启电脑、CCS和板子都无法连接成功。具体错误信息如下：
Error connecting to the target:
(Error -2131 @ 0x0)
Unable to access device register. Reset the device, and retry the operation. If error persists, confirm configuration, power-cycle the board, and/or try more reliable JTAG settings (e.g. lower TCLK).
设备管理器显示信息如下：
尝试过降低仿真器的TCLK，依旧无法连接。Test Connection同样失败，具体信息如下：
[Start: Texas Instruments XDS100v2 USB Debug Probe_0]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
[Result]
—–[Print the board config pathname(s)]————————————
C:\Users\zhy\AppData\Local\TEXASI~1\CCS\
ti\0\0\BrdDat\testBoard.dat
—–[Print the reset-command software log-file]—————————–
This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'Jun 25 2021'.
The library build time was '11:45:30'.
The library package version is '9.4.0.00129'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
—–[Print the reset-command hardware log-file]—————————–
The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).
—–[The log-file for the JTAG TCLK output generated from the PLL]———-
There is no hardware for programming the JTAG TCLK frequency.
—–[Measure the source and frequency of the final JTAG TCLKR input]——–
There is no hardware for measuring the JTAG TCLK frequency.
—–[Perform the standard path-length test on the JTAG IR and DR]———–
This path-length test uses blocks of 64 32-bit words.
The test for the JTAG IR instruction path-length failed.
The many-ones then many-zeros tested length was -2048 bits.
The many-zeros then many-ones tested length was -2048 bits.
The test for the JTAG DR bypass path-length failed.
The JTAG DR bypass scan-path is stuck-at-zero.
—–[Perform the Integrity scan-test on the JTAG IR]————————
This test will use blocks of 64 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 1: scanned out 0xFFFFFFFF and scanned in 0x80000000.
Test 1 Word 2: scanned out 0xFFFFFFFF and scanned in 0xFFFFFBE0.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 2
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 3
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 4
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 5
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 6
Some of the values were corrupted – 83.9 percent.
The JTAG IR Integrity scan-test has failed.
—–[Perform the Integrity scan-test on the JTAG DR]————————
This test will use blocks of 64 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 1: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 2: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 3: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 4: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 5: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 6: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 7: scanned out 0xFFFFFFFF and scanned in 0x00000000.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted – 82.8 percent.
The JTAG DR Integrity scan-test has failed.
[End: Texas Instruments XDS100v2 USB Debug Probe_0]
Green Deng：
你好，这是官方对这个抱错的原因和解决方案描述，你可以先看一下：https://software-dl.ti.com/ccs/esd/documents/ccsv7_debugging_jtag_connectivity_issues.html#device-register
另外你提到有过一次重启CCS成功连接了，可以尝试一下更换别的CCS版本：https://www.ti.com.cn/tool/cn/CCSTUDIO
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Zhou HaoYue：
您好，更换其他版本的CCS依旧无法连接。查看官方的描述也不太明白，因为之前在故障后成功过，无法确定是否是JTAG的问题。
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Green Deng：
这样的话只能做交叉测试才能确定真正的问题所在了。不知道你这边设备数量是否足够，够的话可以多个设备之间做测试，排查具体是那部分硬件的问题。期间，测试烧录用的软件最好用官方的例程：
C:\ti\c2000\C2000Ware_4_01_00_00\device_support\f2837xd\examples
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Zhou HaoYue：
最终发现是核心板和底板的连接松动了。
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Green Deng：
好的，感谢你的反馈。
