TMS320F28035: No source available for "_Application_4_Texas Instruments XDS100v3 USB Debug Probe_0/C28xx_Texas Instruments XDS100v3 USB Debug Probe_0/C28xx_stack_frame_0"

我在下载时出现这个，请问怎么解决

Green Deng：

你好，看下你的target configuration配置是否正确？

另外，试一下用例程能否正常连接烧写：C:\ti\c2000\C2000Ware_4_00_00_00\device_support\f2803x\examples\c28

,

haotian zhao：

[Start: Texas Instruments XDS100v1 USB Debug Probe_0]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

[Result]

—–[Print the board config pathname(s)]————————————

C:\Users\ADMINI~1\AppData\Local\TEXASI~1\ CCS\ccs1110\0\0\BrdDat\testBoard.dat

—–[Print the reset-command software log-file]—————————–

This utility has selected a 100- or 510-class product.This utility will load the adapter 'jioserdesusb.dll'.The library build date was 'Dec 8 2021'.The library build time was '11:16:32'.The library package version is '9.6.0.00172'.The library component version is '35.35.0.0'.The controller does not use a programmable FPGA.The controller has a version number of '4' (0x00000004).The controller has an insertion length of '0' (0x00000000).This utility will attempt to reset the controller.This utility has successfully reset the controller.

—–[Print the reset-command hardware log-file]—————————–

The scan-path will be reset by toggling the JTAG TRST signal.The controller is the FTDI FT2232 with USB interface.The link from controller to target is direct (without cable).The software is configured for FTDI FT2232 features.The controller cannot monitor the value on the EMU[0] pin.The controller cannot monitor the value on the EMU[1] pin.The controller cannot control the timing on output pins.The controller cannot control the timing on input pins.The scan-path link-delay has been set to exactly '0' (0x0000).

—–[The log-file for the JTAG TCLK output generated from the PLL]———-

There is no hardware for programming the JTAG TCLK frequency.

—–[Measure the source and frequency of the final JTAG TCLKR input]——–

There is no hardware for measuring the JTAG TCLK frequency.

—–[Perform the standard path-length test on the JTAG IR and DR]———–

This path-length test uses blocks of 64 32-bit words.

The test for the JTAG IR instruction path-length failed.The JTAG IR instruction scan-path is stuck-at-zero.

The test for the JTAG DR bypass path-length failed.The JTAG DR bypass scan-path is stuck-at-zero.

—–[Perform the Integrity scan-test on the JTAG IR]————————

This test will use blocks of 64 32-bit words.This test will be applied just once.

Do a test using 0xFFFFFFFF.Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x00000000.Test 1 Word 1: scanned out 0xFFFFFFFF and scanned in 0x00000000.Test 1 Word 2: scanned out 0xFFFFFFFF and scanned in 0x00000000.Test 1 Word 3: scanned out 0xFFFFFFFF and scanned in 0x00000000.Test 1 Word 4: scanned out 0xFFFFFFFF and scanned in 0x00000000.Test 1 Word 5: scanned out 0xFFFFFFFF and scanned in 0x00000000.Test 1 Word 6: scanned out 0xFFFFFFFF and scanned in 0x00000000.Test 1 Word 7: scanned out 0xFFFFFFFF and scanned in 0x00000000.The details of the first 8 errors have been provided.The utility will now report only the count of failed tests.Scan tests: 1, skipped: 0, failed: 1Do a test using 0x00000000.Scan tests: 2, skipped: 0, failed: 1Do a test using 0xFE03E0E2.Scan tests: 3, skipped: 0, failed: 2Do a test using 0x01FC1F1D.Scan tests: 4, skipped: 0, failed: 3Do a test using 0x5533CCAA.Scan tests: 5, skipped: 0, failed: 4Do a test using 0xAACC3355.Scan tests: 6, skipped: 0, failed: 5Some of the values were corrupted – 83.3 percent.

The JTAG IR Integrity scan-test has failed.

—–[Perform the Integrity scan-test on the JTAG DR]————————

This test will use blocks of 64 32-bit words.This test will be applied just once.

Do a test using 0xFFFFFFFF.Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x00000000.Test 1 Word 1: scanned out 0xFFFFFFFF and scanned in 0x00000000.Test 1 Word 2: scanned out 0xFFFFFFFF and scanned in 0x00000000.Test 1 Word 3: scanned out 0xFFFFFFFF and scanned in 0x00000000.Test 1 Word 4: scanned out 0xFFFFFFFF and scanned in 0x00000000.Test 1 Word 5: scanned out 0xFFFFFFFF and scanned in 0x00000000.Test 1 Word 6: scanned out 0xFFFFFFFF and scanned in 0x00000000.Test 1 Word 7: scanned out 0xFFFFFFFF and scanned in 0x00000000.The details of the first 8 errors have been provided.The utility will now report only the count of failed tests.Scan tests: 1, skipped: 0, failed: 1Do a test using 0x00000000.Scan tests: 2, skipped: 0, failed: 1Do a test using 0xFE03E0E2.Scan tests: 3, skipped: 0, failed: 2Do a test using 0x01FC1F1D.Scan tests: 4, skipped: 0, failed: 3Do a test using 0x5533CCAA.Scan tests: 5, skipped: 0, failed: 4Do a test using 0xAACC3355.Scan tests: 6, skipped: 0, failed: 5Some of the values were corrupted – 83.3 percent.

The JTAG DR Integrity scan-test has failed.

[End: Texas Instruments XDS100v1 USB Debug Probe_0]

,

Green Deng：

额，你看一下两个地方的描述，问题中报错的是XDS100 V3，连接测试中显示的又是XDS100 V1，不知道你具体使用的是哪款仿真器？

所以建议还是自己核对一下你的target configuration，可能是你自己没有配置对。

另外，不确定软硬件是否正常工程的情况下，先用例程来测试。