LAUNCHXL-F28027: 我买的28027开发板下载不了程序了，错误如下：

[Start: Texas Instruments XDS100v2 USB Emulator_0]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

[Result]

—–[Print the board config pathname(s)]————————————

C:\Users\ADMINI~1\AppData\Local\TEXASI~1\
CCS\ccs1040\0\0\BrdDat\testBoard.dat

—–[Print the reset-command software log-file]—————————–

This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'Jun 25 2021'.
The library build time was '11:45:30'.
The library package version is '9.4.0.00129'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.

—–[Print the reset-command hardware log-file]—————————–

The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).

—–[The log-file for the JTAG TCLK output generated from the PLL]———-

There is no hardware for programming the JTAG TCLK frequency.

—–[Measure the source and frequency of the final JTAG TCLKR input]——–

There is no hardware for measuring the JTAG TCLK frequency.

—–[Perform the standard path-length test on the JTAG IR and DR]———–

This path-length test uses blocks of 64 32-bit words.

The test for the JTAG IR instruction path-length failed.
The JTAG IR instruction scan-path is stuck-at-zero.

The test for the JTAG DR bypass path-length failed.
The JTAG DR bypass scan-path is stuck-at-zero.

—–[Perform the Integrity scan-test on the JTAG IR]————————

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 1: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 2: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 3: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 4: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 5: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 6: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 7: scanned out 0xFFFFFFFF and scanned in 0x00000000.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted – 83.3 percent.

The JTAG IR Integrity scan-test has failed.

—–[Perform the Integrity scan-test on the JTAG DR]————————

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 1: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 2: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 3: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 4: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 5: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 6: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 7: scanned out 0xFFFFFFFF and scanned in 0x00000000.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted – 83.3 percent.

The JTAG DR Integrity scan-test has failed.

[End: Texas Instruments XDS100v2 USB Emulator_0]

jiangtao zhou：

这个论坛这么多年了，上传图片还是这么困难。只能口头描述一下了：CTS拨码开关拨到了上面，处于ON的位置，下面那3个拨码开关，处于OFF的位置

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jiangtao zhou：

在不同的电脑上都试了，CCS是10.4,明天再量一下JTAG TCLK脚和CPU VDD的电压 。

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jiangtao zhou：

量出tclk 3.3 vddA 3.3V vdd 1.9V 

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Green Deng：

额，抱歉啊，目前这边也没有F28027的launchPAD，只能根据users guide上面的说明来支持一下。

诸如S1开关有说明：

The first time the LAUNCHXL-F28027 is used, a demo application automatically starts when the board is powered from a USB host. If your board does not start the demo application, try placing S1 in the following positions and resetting the board: UP – UP – DOWN. To start the demo, connect the LAUNCHXL-F28027 with the included mini-USB cable to a free USB port. The demo application starts with the LEDs flashing to show the device is active.

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Green Deng：

https://www.ti2k.com/wp-content/uploads/ti2k/DeyiSupport_C2000_spruhh2c.pdf